Texture optimization process of ZnO:Al thin films using NH₄Cl aqueous solution for applications as antireflective coating in thin film solar cellsFERNANDEZ, S; GANDIA, J. J.Thin solid films. 2012, Vol 520, Num 14, pp 4698-4702, issn 0040-6090, 5 p.Conference Paper

Metal-induced negative oxide charge detected by an alternating current surface photovoltage in thermally oxidized Fe-contaminated n-type Si (001) wafersSHIMIZU, Hirofumi; OTSUKI, Tomohiro.Thin solid films. 2012, Vol 520, Num 14, pp 4808-4811, issn 0040-6090, 4 p.Conference Paper

Fabrication of porous Pt-Pd electrodes using solid state interdiffusionNAZARPOUR, S; CHAKER, M.Thin solid films. 2012, Vol 520, Num 14, pp 4812-4815, issn 0040-6090, 4 p.Conference Paper

Proceedings of the EMRS 2011 Spring Meeting Symposium D: Processing and Characterization of Nanoscale Multi Functional Oxide Films IIICRACIUN, Valentin; GUILLOUX-VIRY, Maryline; ALEXE, Marin et al.Thin solid films. 2012, Vol 520, Num 14, issn 0040-6090, 323 p.Conference Proceedings

Chemical vapor deposition growth of Fe₃0₄ thin films and Fe/Fe₃0₄ bi-layers for their integration in magnetic tunnel junctionsVANGELISTA, S; MANTOVAN, R; COCCO, S et al.Thin solid films. 2012, Vol 520, Num 14, pp 4617-4621, issn 0040-6090, 5 p.Conference Paper

Development of two-step etching approach for aluminium doped zinc oxide using a combination of standard HCl and NH₄Cl etch stepsFERNANDEZ, S; PUST, S. E; HÜPKES, J et al.Thin solid films. 2012, Vol 520, Num 14, pp 4678-4684, issn 0040-6090, 7 p.Conference Paper

Doping transition of doped ZnO nanorods measured by Kelvin probe force microscopyVAN BEN, Chu; HAK DONG CHO; TAE WON KANG et al.Thin solid films. 2012, Vol 520, Num 14, pp 4622-4625, issn 0040-6090, 4 p.Conference Paper

Epitaxial growth and electrical measurement of single crystalline Pb(Zr_0.52Ti_0.48)O₃ thin film on Si(001) for micro-electromechanical systemsYIN, S; NIU, G; VILQUIN, B et al.Thin solid films. 2012, Vol 520, Num 14, pp 4572-4575, issn 0040-6090, 4 p.Conference Paper

Structural, electrical and optical properties of thermochromic VO₂ thin films obtained by reactive electron beam evaporationLEROY, J; BESSAUDOU, A; COSSET, F et al.Thin solid films. 2012, Vol 520, Num 14, pp 4823-4825, issn 0040-6090, 3 p.Conference Paper

Synthesis of magnetic tunnel junctions with full in situ atomic layer and chemical vapor deposition processesMANTOVAN, R; VANGELISTA, S; KUTRZEBA-KOTOWSKA, B et al.Thin solid films. 2012, Vol 520, Num 14, pp 4820-4822, issn 0040-6090, 3 p.Conference Paper

Atomic layer deposited TiO₂ for implantable brain-chip interfacing devicesCIANCI, E; LATTANZIO, S; SEGUINI, G et al.Thin solid films. 2012, Vol 520, Num 14, pp 4745-4748, issn 0040-6090, 4 p.Conference Paper

Catalyst size limitation in vapor-liquid-solid ZnO nanowire growth using pulsed laser depositionMARCU, A; TRUPINA, L; ZAMANI, R et al.Thin solid films. 2012, Vol 520, Num 14, pp 4626-4631, issn 0040-6090, 6 p.Conference Paper

Comparison of structural and photoluminescence properties of zinc oxide nanowires grown by vapor-solid and vapor-liquid-solid methodsMOUSAVI, S. H; HARATIZADEH, H; MINAEE, H et al.Thin solid films. 2012, Vol 520, Num 14, pp 4642-4645, issn 0040-6090, 4 p.Conference Paper

Effect of substrate morphology on the nucleation and growth of ZnO nanorods prepared by spray pyrolysisDEDOVA, T; ACIK, I. Oja; KRUNKS, M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4650-4653, issn 0040-6090, 4 p.Conference Paper

Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detectionJAGTAP, Vishal S; DEGARDIN, Annick F; KREISLER, Alain J et al.Thin solid films. 2012, Vol 520, Num 14, pp 4754-4757, issn 0040-6090, 4 p.Conference Paper

Optical properties of amorphous-like indium zinc oxide and indium gallium zinc oxide thin filmsGALCA, A. C; SOCOL, G; CRACIUN, V et al.Thin solid films. 2012, Vol 520, Num 14, pp 4722-4725, issn 0040-6090, 4 p.Conference Paper

Oxidation of nanostructured Ti films produced by low energy cluster beam deposition: An X-ray Photoelectron Spectroscopy characterizationDESIMONE, Monica; SNIDERO, Elena; CORENO, Marcello et al.Thin solid films. 2012, Vol 520, Num 14, pp 4803-4807, issn 0040-6090, 5 p.Conference Paper

Resistance switching properties of molybdenum oxide filmsARITA, M; KAJI, H; FUJII, T et al.Thin solid films. 2012, Vol 520, Num 14, pp 4762-4767, issn 0040-6090, 6 p.Conference Paper

Characterization of sol-gel derived TiO₂/ZrO₂ films and powders by Raman spectroscopyNAUMENKO, A; GNATIUK, Iu; SMIRNOVA, N et al.Thin solid films. 2012, Vol 520, Num 14, pp 4541-4546, issn 0040-6090, 6 p.Conference Paper

Correlation between strain and the metal-insulator transition in epitaxial V₂O₃ thin films grown by Molecular Beam EpitaxyDILLEMANS, L; LIETEN, R. R; MENGHINI, M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4730-4733, issn 0040-6090, 4 p.Conference Paper

Defect generation during silicon oxidation: A Kinetic Monte Carlo studyALI-MESSAOUD, A; CHIKOUCHE, A; ESTEVE, A et al.Thin solid films. 2012, Vol 520, Num 14, pp 4734-4740, issn 0040-6090, 7 p.Conference Paper

Electronic structure and formation mechanism of complex Ti-Nb oxideKHOVIV, D. A; ZAYTSEV, S. V; IEVLEV, V. M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4797-4799, issn 0040-6090, 3 p.Conference Paper

Fabrication and characterization of nanoporous ZnO layers for sensing applicationsWAGNER, Alexander; BAKIN, Andrey; OTTO, Torsten et al.Thin solid films. 2012, Vol 520, Num 14, pp 4662-4665, issn 0040-6090, 4 p.Conference Paper

High quality epitaxial ZnO films grown on solid-phase crystallized buffer layersKUWAHARA, Kazunari; ITAGAKI, Naho; NAKAHARA, Kenta et al.Thin solid films. 2012, Vol 520, Num 14, pp 4674-4677, issn 0040-6090, 4 p.Conference Paper

Introduction of zirconium oxide in a hardmask concept for highly selective patterning of scaled high aspect ratio trenches in siliconPAUL, Jan; RIEDEL, Stefan; RUDOLPH, Matthias et al.Thin solid films. 2012, Vol 520, Num 14, pp 4527-4531, issn 0040-6090, 5 p.Conference Paper